Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 400 mesh Nickel Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Nickel
Electron Microscopy Sciences Para/Gard™ Paraffin Repellent 4 OZ
A paraffin repellent for countertops as well as equipment. Just spray and wipe away. No more paraffin build up around your work area. ParaGard is a pleasant smelling, non-toxic spray which is safe for use on metal, wood, and plastic surfaces.
Electron Microscopy Sciences Shorter Pin SEM Stub 45° Low Profile, 1/2" Head with 1/4" Pin, Aluminum
45° Low Profile SEM stub specimen mount with shorter pin (6 mm) and 45 degree mounting surfaces for use with Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Pin height: 1/4"
Electron Microscopy Sciences Carbon (Graphite) Rods Spectro-Grade, 3/16" diameter, 12" OAL
Carbon Rods (graphite) with an impurity level of 2ppm or less with a maximum level element of each of 1 ppm. Ideal for all TEM, SEM and other critical applications.
Diameter: 3/16"
OAL: 12"
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/1-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 1.0 µm spacing.
Mesh: 200
Material: Copper
KLARMANN RULINGS INC Miller Disc Reticle Corner, 20 mm
A squared reticle can be used for counting. Here the basic principle is that a small area of the specimen is analyzed in order to obtain information about the total area. This removes much irksome work and is preferable in certain instances to analyzing the whole area. For example when it is desired to compare the proportion of large to small particles in a specimen, by using the Miller Disc, the smaller particles may be counted only in the small square, the result being multiplied by ten for comparison with the number of larger particles in the large square.
Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 16 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 16 mm
Electron Microscopy Sciences CoverWell™ Imaging Chamber 1 well 20 mm, 0.8mm depth, 180 µl Volume
CoverWell Imaging reusable press-to-seal silicone chambers form a removable enclosure for repeat staining or specimen repositioning. The chambers are designed to stabilize and support thick and free-floating specimens for confocal microscopy and imaging applications.
Diameter: 20 mm
Depth: 0.8 mm
Volume: 180 µl
O.D.: 25 mm x 25 mm
Electron Microscopy Sciences British Standard Graticle NG10, 21mm
In this graticule the circle areas double progressively, hence the diameters alter by Root 2, so that the size classes can form a continuation of the standard series of sieves for particle sizing. Each particle is assigned to a size class defined by two adjacent circles, which represent the size limits of that class. Thus the distribution of size is obtained in terms of the diameter of circles having the same projected area as the particles. This method will cover particles in the range 150 micron to 0.38 micron. The size distributions with respect to their number and weight are determined separately. Final results are calculated as cumulative percents.
Originally designed by the National Coal Board for use in coal mining.
Size: 21 mm
Hach Company 3/4 Inch Combination pH/ORP Sensor, Convertible Style, Ryton Body Material, General Purpose Glass pH Electrode, No Temperature Compensation, 15 ft Cable
Ryton, Convertible Body Style, 4.5m Analog Cable, General Purpose Glass pH Electrode, No Temperature Compensation
Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2DUTC for AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1" head with 1/2" Pin, Aluminum, 3.1 mm Pin diameter
Scanning electron microscope specimen mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 1/2"
Pin diameter: 3.1 mm
Electron Microscopy Sciences Gold Coated Specimen Discs for AFM, 12 mm
Magnetic stainless steel gold coated specimen discs have smooth edges and consistently flat surfaces to ensure secure holding. Specimens can be mounted directly on the metal discs with double sided tape, epoxy or conductive paste. If a mica specimen support is needed, the mica discs can be easily mounted on the metal support discs.
These discs offer excellent resistance to electromigration, high electrical and thermal conductivity, and high temperatures making them excellent substrates for mounting specimens. Packaged in a polystyrene disc storage box.
Diameter: 12 mm
Electron Microscopy Sciences Weibel 2 Graticle NGW2, 16mm
Used when making a surface to volume ratio of a structure per mass unit. This graticule consists of a number of short lines with interruptions as long as the lines. Basically, the number of intersections falling over the short lines is counted and the number of endpoints falling on the end of the structure is determined. Reference: E.R. Weibel, Journal of Microscopy Vol. 95. pp 373-378. Current Capabilities and Limitations of Available Sterrological Technique, point counting method.
Size: 16 mm
Electron Microscopy Sciences EMS Gold Aperture with 40 µm hole, 2 mm O.D., 0.53 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 40 µm
O.D.: 2 mm
Thickness: 0.53 mm